کنفرانس مهندسی برق ایران

صفحه اصلی / سی و یکمین کنفرانس بین المللی مهندسی برق

T-type L-2L De-Embedding Method for On-Wafer T-model Transmission Line Network

نویسندگان :

Milad Seyedi¹ Nasser Masoumi² Samad Sheikhaei³

1- University of Tehran 2- University of Waterloo 3- University of Tehran

کلمات کلیدی :

L-2L De-Embeding،de-embedding،IC pad،RAW Device،S-Parameters،Microstrip line،Device Under Test (DUT)

چکیده :

This paper presents an extensive evaluation for a new type of the L–2L de-embedding method applied to on-chip de-embedding. We derive analytical formulas to discuss and verify the accuracy of the improved and extended method called the T-type L-2L de-embedding. The case study structure to apply the new method consists of a microstrip line combined with two left- and right-side pads. For the simulation of the structures, HFSS 3D electromagnetic (EM) simulator is used. The results show that the T-type L-2L exhibits better accuracy compared with the other on-wafer de-embedding methods for a device under test (DUT).

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بیشتر

ثمین همایش، سامانه مدیریت کنفرانس ها و جشنواره ها - نگارش 42.5.3