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صفحه اصلی
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سی و یکمین کنفرانس بین المللی مهندسی برق
T-type L-2L De-Embedding Method for On-Wafer T-model Transmission Line Network
نویسندگان :
Milad Seyedi
1
Nasser Masoumi
2
Samad Sheikhaei
3
1- University of Tehran
2- University of Waterloo
3- University of Tehran
کلمات کلیدی :
L-2L De-Embeding،de-embedding،IC pad،RAW Device،S-Parameters،Microstrip line،Device Under Test (DUT)
چکیده :
This paper presents an extensive evaluation for a new type of the L–2L de-embedding method applied to on-chip de-embedding. We derive analytical formulas to discuss and verify the accuracy of the improved and extended method called the T-type L-2L de-embedding. The case study structure to apply the new method consists of a microstrip line combined with two left- and right-side pads. For the simulation of the structures, HFSS 3D electromagnetic (EM) simulator is used. The results show that the T-type L-2L exhibits better accuracy compared with the other on-wafer de-embedding methods for a device under test (DUT).
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بیشتر
ثمین همایش، سامانه مدیریت کنفرانس ها و جشنواره ها - نگارش 43.6.0
